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ZEISS 435VP Scanning Electron Microscope |
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With:
Secondary Electron Imaging
Electron Dispersive Spectrometry
Cryo-preparation Unit and Cryo-stage
Backscatter Electron Imaging |
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Specimen stage, holder, and chamber |
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JEOL 1200EX II Transmission Electron Microscope |
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Denton Desk II Sputter Coater |
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Pelco Critical Point Dryer |
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Reichert Ultracut E Ultramicrotome |
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Leica Aristoplan with Spot Camera |
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Pelco Microwave Oven with ColdSpot |
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