Equipment

ZEISS 435VP Scanning Electron Microscope

JEOL 1200EX II Transmission Electron Microscope

Provides:

Secondary Electron Imaging

Electron Dispersive Spectrometry

Cryo-preparation Unit and Cryo-stage

Backscatter Electron Imaging

JEOL202
LEOSEM_sm205
LeicaAristoplanandSpot2

Leica Aristoplan with Spot Camera

ReichertUltracutE2

Reichert Ultracut E Ultramicrotome

FreezeDryer2

Emitech Freeze Dryer

SEMstagetilt2

Specimen stage, holder,
and chamber

PelcoCPD2

Pelco Critical Point Dryer

DentonDeskIISputterCoater2

Denton Desk II Sputter Coater

ImagingStation202

Imaging Station

MicrowaveChamber12

Pelco Microwave Oven with ColdSpot

Imaging and Histology Core Facility

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