3.2.2.4. Absorbed Current Imaging

The MBX microprobe can image materials using the absorbed current. The specimen or absorbed current is produced by inelastic scattering and absorption of incident electrons and is the difference between electrons entering the sample and electrons leaving as backscattered, secondary, transmitted, and Auger electrons. Absorbed current is measured relative to ground and depends largely on the atomic number of the elements in the sample in a manner opposite to that of backscattered electrons. However, it is sensitive to carbon coating problems, so absorbed current imaging is not as useful as backscattered imaging.