Line intensities are a function of transition probabilities and the rate at which the appropriate atomic shell is ionized by the incident electrons. The probability of ionization is a function of the effective target-atom ionization "cross-section," Q. The ionization cross-section is small (0.01 Å) compared with the typical atomic diameter (1 Å) and decreases with increasing atomic number. Thus, only a small proportion of atoms in the target material are ionized. Line intensities may be described by an empirical relationship:
![[Line Intensity]](img/LineInt.gif)
Thus, the intensity of a line depends on the amount to which Eo exceeds Ec (Figure 2.5.3.6). The ratio Eo/Ec is termed the overvoltage. Optimal overvoltages may be calculated using the expression for the capture cross-section (Q) for a given shell. For example, for the K-shell this is:

Recommended values for the K-shell are bs = 0.9 and Cs = 0.65. Typical capture cross-sections for the K shell are on the order of 10-20 cm2, about a hundredth of the atomic diameter. Clearly, K-shell ionization has a very low probability! This function peaks at Eo of about 2.5 times Ec, thus this overvoltage for K-lines is optimal. With higher Eo and higher overvoltages, there is a greater chance of decreasing X-ray intensities through the production of satellite peaks.
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Figure 2.5.3.6. Spectra of pure copper taken at accelerating voltages of 10 keV (above) and 20 keV (below). At 10 keV, only the L lines are efficiently excited (Kab = 8.98 keV) (after Kevex Corporation 1983). |
Copyright 1997-2003, James H. Wittke
Last update: 01/18/2006 01:47 PM.